New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies
type: CreativeWork
description: L'abstract è presente nell'allegato / the abstract is in the attachment
abstract: L'abstract è presente nell'allegato / the abstract is in the attachment
author: SARTONI, SANDRO
language: eng
keywords: aging, sbst, safety, delay-faults, Settore ING-INF/05 - Sistemi di Elaborazione delle Informazioni
date published: 2023-11-03
date modified: 2026-07-24T03:50:56Z
provider: Politecnico di Torino
publisher: Networked Digital Library of Theses and Dissertations
type: WebPage
source organization: Politecnico di Torino

PropertyValue
property ID: Handle
value: https://hdl.handle.net/11583/2984181