A Reliability and Survivability Analysis of US Local Telecommunication Switches that Experience Frequent Outages

This thesis analyzes the reliability and survivability of US local telecommunication switches that experienced frequent outages over a 14-year study period (from 1996 to 2009), using local switch outage data. Different information on those outages has been used to investigate their causes, failure trends and impacts. A total of 12,860 switch outages were investigated, and 2,623 of those outages were found to come from only 156 unique switches that experienced eight outages or more each over the study period. The data were separated into two categories, which were also compared: more frequently failing switches and less frequently failing switches. Major findings are that scheduled maintenance activities and hardware failures are the major causes of outages in local telecommunication switches; there are significant reliability and survivability decreases in more frequently failing switches; and there are considerable differences in the causes/impacts of outages and the switch characteristics between the two categories.

Name thesis:degree_name

Master of Information and Telecommunication Systems (MITS)

Level thesis:degree_level

masters

Discipline thesis:degree_discipline

Information and Telecommunication Systems (Communication)

Grantor dc:publisher

Ohio University

Year dc:date

2013

Author dc:creator

• Shyirambere, Aimee S.

Contributors dc:contributor

• Snow, Andrew

• Information Systems
• Information Technology
• Telecommunication
• local switches
• reliability
• survivability
• public switched telephone network
• switch outages

Statement dc:rights

• unrestricted
• This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

Language dc:language

English

Repository record dc:identifier

http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1365724373

OAI identifier oai:identifier

oai:etd.ohiolink.edu:ohiou1365724373