In electronic systems, it is interesting to understand exactly how the reliability is changing with time. Dynamic performance changes when a system passes from infant mortality stage into useful life phase and when the system passes from useful life phase into wearout phase. Dynamic performance also changes when the system is redesigned or when the system is acted on by a number of other outside forces such as a change in maintenance policy, escalation of alignment problems, or a change in training program. It is important to know when a system is changing dynamically in order to assess design, policy and program changes and to determine when changes in life cycle phase are occurring.
This study presents a methodology to analyze the reliability of electronic systems as they change in time dynamically. The method is developed mathematically and is proven with a simulation to be able to estimate system MTBF and to be able to determine when process changes occur. Three case studies of problem power supplies are provided to illustrate how the technique has been used to make cost avoidance decisions.
","abstract_html":"<p>In electronic systems, it is interesting to understand exactly how the reliability is changing with time. Dynamic performance changes when a system passes from infant mortality stage into useful life phase and when the system passes from useful life phase into wearout phase. Dynamic performance also changes when the system is redesigned or when the system is acted on by a number of other outside forces such as a change in maintenance policy, escalation of alignment problems, or a change in training program. It is important to know when a system is changing dynamically in order to assess design, policy and program changes and to determine when changes in life cycle phase are occurring.</p> <p>This study presents a methodology to analyze the reliability of electronic systems as they change in time dynamically. The method is developed mathematically and is proven with a simulation to be able to estimate system MTBF and to be able to determine when process changes occur. Three case studies of problem power supplies are provided to illustrate how the technique has been used to make cost avoidance decisions.</p>","abstract_has_math":false,"creators":["Luke, Stephen R."],"institution":null,"degree_name":"Master of Science (MS)","degree_level":"Thesis","degree_discipline":"Engineering Management & Systems Engineering","degree_department":null,"school":null,"contributors":["Derya A. Jacobs","Resit Unal","Billie Reed","Frederick Steier"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1993,"date_issued":"1993-01-01T08:00:00Z","date_published":"1993-01-01T08:00:00Z","updated_at":"2026-07-24T03:35:00Z","subjects":["Reliability","Electrical systems","Dynamic performance","Applied Statistics","Electrical and Computer Engineering","Systems Engineering"],"languages":[],"rights":[],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://digitalcommons.odu.edu/emse_etds/148","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Derya A. Jacobs","Resit Unal","Billie Reed","Frederick Steier"]},{"key":"dc:creator","label":"Author","values":["Luke, Stephen R."]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.available","label":"Dc Date Available","values":["2019-08-14T07:00:00Z"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Engineering Management & Systems Engineering"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Thesis"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science (MS)"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Reliability","Electrical systems","Dynamic performance","Applied Statistics","Electrical and Computer Engineering","Systems Engineering"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://digitalcommons.odu.edu/emse_etds/148"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["In electronic systems, it is interesting to understand exactly how the reliability is changing with time. Dynamic performance changes when a system passes from infant mortality stage into useful life phase and when the system passes from useful life phase into wearout phase. Dynamic performance also changes when the system is redesigned or when the system is acted on by a number of other outside forces such as a change in maintenance policy, escalation of alignment problems, or a change in training program. It is important to know when a system is changing dynamically in order to assess design, policy and program changes and to determine when changes in life cycle phase are occurring.
This study presents a methodology to analyze the reliability of electronic systems as they change in time dynamically. The method is developed mathematically and is proven with a simulation to be able to estimate system MTBF and to be able to determine when process changes occur. Three case studies of problem power supplies are provided to illustrate how the technique has been used to make cost avoidance decisions.
"]},{"key":"dc:title","label":"Title","values":["Reliability Trend Analyses With Statistical Confidence Limits Using the Luke Reliability Trend Chart"]}]}],"canonical_facts":{"dc:contributor":["Derya A. Jacobs","Resit Unal","Billie Reed","Frederick Steier"],"dc:creator":["Luke, Stephen R."],"dc:date.available":["2019-08-14T07:00:00Z"],"dc:description.abstract":["In electronic systems, it is interesting to understand exactly how the reliability is changing with time. Dynamic performance changes when a system passes from infant mortality stage into useful life phase and when the system passes from useful life phase into wearout phase. Dynamic performance also changes when the system is redesigned or when the system is acted on by a number of other outside forces such as a change in maintenance policy, escalation of alignment problems, or a change in training program. It is important to know when a system is changing dynamically in order to assess design, policy and program changes and to determine when changes in life cycle phase are occurring.
This study presents a methodology to analyze the reliability of electronic systems as they change in time dynamically. The method is developed mathematically and is proven with a simulation to be able to estimate system MTBF and to be able to determine when process changes occur. Three case studies of problem power supplies are provided to illustrate how the technique has been used to make cost avoidance decisions.
"],"dc:identifier":["https://digitalcommons.odu.edu/emse_etds/148"],"dc:subject":["Reliability","Electrical systems","Dynamic performance","Applied Statistics","Electrical and Computer Engineering","Systems Engineering"],"dc:title":["Reliability Trend Analyses With Statistical Confidence Limits Using the Luke Reliability Trend Chart"],"thesis:degree_discipline":["Engineering Management & Systems Engineering"],"thesis:degree_level":["Thesis"],"thesis:degree_name":["Master of Science (MS)"]},"updated_at":"2026-07-24T03:35:00Z"}