Design of a universal test platform for radiation testing of digital components

In this research, programmable, microcontroller-based test hardware was designed, constructed, debugged, and programmed. The wire-wrapped board will be used to test two custom static random access memory (SRAM) chips, as well as other custom chips designed at the Naval Postgraduate School. Components for the test hardware were selected to allow prototyping with standard parts that can later be replaced with radiation hardened parts as budgets permit. Control of the test hardware is via a RS-232 serial interface, which allows remote control programming and monitoring of the test hardware and device being tested.

Grantor dc:publisher

Monterey, California. Naval Postgraduate School

Year dc:date.issued

1996

Author dc:creator

• Amsler, Duane E.

Advisor dc:contributor.advisor

• Fouts, Douglas J.

Language dc:language.iso

en_US

Handle dc:identifier.uri

https://hdl.handle.net/10945/32211

OAI identifier oai:identifier

oai:calhoun.nps.edu:10945/32211