Transport imaging in the one dimensional limit

Transport imaging is a SEM-based technique used to directly image the motion and recombination of charge in luminescent semiconductors, allowing for the extraction of transport parameters critical to device operation. In this thesis, transport imaging for 1D structures was initiated with work on sample preparation, modeling and initial characterization. One dimensional structures are being integrated into forefront electronics due to their inherent advantages in size, packing density and power consumption. In this work the one dimensional equation for steady state minority carrier recombination distribution solved for the Gaussian source is derived and results from numerical simulations are presented. The diameter of the SEM beam is determined experimentally allowing for accurate simulation parameters. Intensity and drift measurements on four batches of top-down wire structure samples, fabricated on a AlGaAs/GaAs/AlGaAs double heterostructure using a FIB, are presented. Significant decreases in luminescence in FIB exposed regions are reported. Spatial luminescence from single bottom-up GaN and ZnO nanowires deposited by metal initiated metal-organic CVD on Au and SiO2 substrates is imaged. CL spectra for GaN and ZnO, with peak intensities at 3.27 and 3.29 eV, are characterized. Finally, several suggestions for further research are offered including transport imaging on contacted bottom-up nanowires and a potential application of transport imaging to FIB damage characterization.

Department dc:contributor.department

Physics (PH)

Grantor dc:publisher

Monterey, CA; Naval Postgraduate School

Year dc:date.issued

2006

Author dc:creator

• Winchell, Stephen D.

Advisor dc:contributor.advisor

• Haegel, Nancy M.

Statement dc:rights

• This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. As such, it is in the public domain, and under the provisions of Title 17, United States Code, Section 105, is not copyrighted in the U.S.

Handle dc:identifier.uri

https://hdl.handle.net/10945/2698

OAI identifier oai:identifier

oai:calhoun.nps.edu:10945/2698