Point Defect Identification and Management for Sub-300 nm Light Emitting Diodes and Laser Diodes Grown on Bulk AlN Substrates

Bryan, Zachary A

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North Carolina State University

Point Defect Identification and Management for Sub-300 nm Light Emitting Diodes and Laser Diodes Grown on Bulk AlN Substrates

dc:creator Bryan, Zachary A

dc:date.issued2015

Abstract

dc:description

North Carolina State University Theses Materials Science and Engineering.

Author and committee

dc:creator, dc:contributor.*

Author dc:creator: Bryan, Zachary A
Advisors dc:contributor.advisor: Ramon Collazo, Chair
Zlatko Sitar, Member
Douglas Irving, Member
Mehmet Ozturk, Minor

Identifiers

dc:identifier.*

Dc Identifier Other: deg4486
OAI record oai:identifier: https://repository.lib.ncsu.edu/server/oai/request?verb=GetRecord&metadataPrefix=dim&identifier=oai%3Arepository.lib.ncsu.edu%3A1840.16%2F11377

Chain of custody

source

Harvested from: North Carolina State University
Base URL: repository.lib.ncsu.edu/server/oai/request
Last updated: 2026-08-21
Source record: OAI-PMH GetRecord

related terms

ncsu
2015

citation

Bryan, Zachary A. Point Defect Identification and Management for Sub-300 nm Light Emitting Diodes and Laser Diodes Grown on Bulk AlN Substrates. 2015. http://www.lib.ncsu.edu/resolver/1840.16/11377

Point Defect Identification and Management for Sub-300 nm Light Emitting Diodes and Laser Diodes Grown on Bulk AlN Substrates

Abstract

Author and committee

Identifiers

Chain of custody

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