Modeling and Analysis Methods for ESD and EMI Problems
"Electrostatic discharge (ESD) failures and Electromagnetic interference (EMI) problems are becoming more critical in electronic devices and large systems. In this work, four studies are presented to model and analyze ESD and EMI problems. First, a simplified physical-based model for deep-snapback transient voltage suppressors (TVS) is developed. While based on physics, the number of parameters and components is minimized. Results show that the proposed model captures the most important behaviors of the TVS response using a limited number of parameters, allowing the model to be tuned relatively easily using data obtained only from package-level transient and quasi-static measurements. Second, a phaseless EMI source imaging method is proposed based on microwave holography. The field produced by the device under test (DUT) is not measured directly; instead, the interference pattern between the emitted field and the reference wave is created and measured as a hologram. Third, a simulation methodology is presented to analyze the acoustic noise created by MLCCs on a PCB. A simulation model for the PCB vibration modal response is built to analyze the harmonic response of the PCB excited by the capacitor. Total response is obtained by multiplying the measured power noise spectrum on the MLCC with the simulated deformation of the PCB found from the harmonic response analysis. The proposed method shows promise for analyzing and predicting the acoustic noise from singing capacitors. Finally, the unwanted magnetic field coupling mechanism of shielded magnetic near-field probe is revealed and analyzed"-- Abstract, p. iv
Electrical and Computer Engineering, Engineering
Missouri University of Science and Technology
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