Characterization and modeling of ESD events and near-field scanning calibration structures

<p>"This research is divided into three papers that cover, two major topics. The first topic, system-level electrostatic discharge (ESD), is discussed over the course of two papers. The second topic, a calibration structure for near-field scanning probe calibration application, is discussed in the last paper. In the first paper, software-assisted detection methods are proposed for secondary ESD discharges. The measured waveforms are analyzed with respect to waveform parameters, such as the vertical threshold of the rising edge, the derivative of the current waveform, and total charge delivered. These parameters enable automatic detection of secondary ESD while monitoring the discharge waveform at the ESD generator tip. In the second paper, the worst-case risk caused due to sparkless discharges to electronic touchscreens is investigated. The statistical behavior of the induced currents is determined for different parameters such as a change in glass thickness, indium tin oxide layer equivalent resistance, sensor spacing to the ground plane, ESD generator air discharge polarity and test voltage. In addition, a full-wave simulation model is developed to reproduce the displacement current flowing through the glass into the display's inner electronic structures. In the third paper, a method is proposed to calibrate a probe by placing it into a known field and referencing its output voltage to the known field. The near-field is measured by using E- and H-field electromagnetic interference probes. A calibration structure is built from a grounded coplanar waveguide to determine the probe factor for near-field scanning applications. The effect of non-TEM modes is easily underestimated such that non-TEM fields prevent the user from determining the unwanted field suppression of probes at higher frequencies"--Abstract, page iv.</p>

Name thesis:degree_name

Ph. D. in Electrical Engineering

Grantor

Missouri University of Science and Technology

Author dc:creator

• Marathe, Shubhankar Kashinath

• Display
• Electrostatic Discharge
• Near-Field Scanning
• Probe Calibration
• Secondary ESD
• System-Level ESD
• Electromagnetics and Photonics

Repository record dc:identifier

https://scholarsmine.mst.edu/doctoral_dissertations/2840

OAI identifier oai:identifier

oai:scholarsmine.mst.edu:doctoral_dissertations-3845