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Missouri University of Science and Technology

EMI measurement and modeling techniques for complex electronic circuits and modules

Abstract

dc:description.abstract

<p>"This dissertation consists of four papers. In the first paper, a combined model for predicting the most critical radiated emissions and total radiated power due to the display signals in a TV by incorporating the main processing board using the Huygens Equivalence theorem and the radiation due to the flex cable based on active probe measurements was developed.</p> <p>In the second paper, a frequency-tunable resonant magnetic field probe was designed in the frequency range 900-2260 MHz for near-field scanning applications for the radio frequency interference studies by using a varactor diode providing the required capacitance and the parasitic inductance of a magnetic field loop (i.e., a parallel LC circuit). Measurement results showed good agreement with the simulated results.</p> <p>In the third paper, a wideband microwave method was developed as a means for rapid detection of slight dissimilarities (including counterfeit) and aging effects in integrated circuits (ICs) based on measuring the complex reflection coefficient of an IC when illuminated with an open-ended rectangular waveguide probe, at K-band (18-26.5 GHz) and Ka-band (26.5-40 GHz) microwave frequencies.</p> <p>In the fourth paper, a method to predict radiated emissions from DC-DC converters with cables attached on the input side to a LISN and on the output side to a DC brushless motor as load based on linear terminal equivalent circuit modeling was demonstrated. The linear terminal equivalent model was extracted using measured input and output side common mode currents for various characterization impedances connected at the input and output terminals of the converter"--Abstract, page iv.</p>

Degree

thesis:*
Name thesis:degree_name
Ph. D. in Electrical Engineering
Grantor
Missouri University of Science and Technology

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Shinde, Satyajeet

Subjects

dc:subject × 7

Identifiers

dc:identifier.*
OAI identifier oai:identifier
oai:scholarsmine.mst.edu:doctoral_dissertations-3644

Chain of custody

source
Harvested from
Missouri University of Science and Technology
Base URL
scholarsmine.mst.edu/do/oai/
Last updated
2026-07-24
Source record
OAI-PMH GetRecord
citation

Shinde, Satyajeet. EMI measurement and modeling techniques for complex electronic circuits and modules. Missouri University of Science and Technology, https://scholarsmine.mst.edu/doctoral_dissertations/2639