System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms

"The exposure of electronic circuits to lightning, electrostatic discharge (ESD), electrical fast transients (EFT) or sine wave signals can reveal RF immunity problems. Typical problems include temporary malfunctions or permanent damage of integrated circuits (ICs). In an effort to reproduce those disturbances, a series of electromagnetic compatibility standards has been developed. However, a complete understanding of the root cause of the immunity problems has yet to be established. This dissertation discusses immunity problems in three papers, starting at the system level, via the coupling path into the IC"--Abstract, page iv.

Name thesis:degree_name

Ph. D. in Electrical Engineering

Grantor

Missouri University of Science and Technology

Year dc:date.available

2016

Author dc:creator

• Koo, Jayong

• Electrical and Computer Engineering

Repository record dc:identifier

https://scholarsmine.mst.edu/doctoral_dissertations/2287

OAI identifier oai:identifier

oai:scholarsmine.mst.edu:doctoral_dissertations-3289