{"id":{"repo_id":"moncton","oai_identifier":"oai:umoncton.scholaris.ca:20.500.14658/7814"},"canonical_url":"https://search.dev.ndltd.org/etd/moncton/oai:umoncton.scholaris.ca:20.500.14658/7814","repository":{"repo_id":"moncton","name":"University de Moncton","base_url":"https://umoncton.scholaris.ca/server/oai/request"},"display":{"title":"Investigation de la déformation spectrale d'un appareil optique à irradiation polychromatique","abstract":""L'objectif de cette thèse est de développer et des tester diverses méthodes de correction permettant de corriger numériques les spectres optiques obtenus avec l'ellipsomètre de fabrication locale."-- f. 4","abstract_html":""L'objectif de cette thèse est de développer et des tester diverses méthodes de correction permettant de corriger numériques les spectres optiques obtenus avec l'ellipsomètre de fabrication locale."-- f. 4","abstract_has_math":false,"creators":["Cyr, Richard"],"institution":"Université de Moncton","degree_name":"Maîtrise ès sciences (physique)","degree_level":"2e cycle","degree_discipline":"Faculté des sciences","degree_department":null,"school":null,"contributors":[],"advisors":["Beaudoin, Normand","Gauvin, Serge"],"committee_chairs":[],"committee_members":[],"year":2011,"date_issued":"2011","date_published":"2011","updated_at":"2026-07-24T03:10:09Z","subjects":["Spectroscopie optique","Polarisation (Lumière)","Optique","Instruments","Ellipsométrie","Mesures optiques","Semi-conducteurs","Essais","Méthodes optiques","Couches minces"],"languages":["iso639-2b","fre"],"rights":["Author"],"rights_urls":[],"identifier_entries":[{"key":"dc:identifier","label":"Identifier","values":["oclc: 799231851"],"render_values":[{"text":"oclc: 799231851","href":null,"code":true}]},{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["umir:1415"],"render_values":[{"text":"umir:1415","href":null,"code":true}]}]},"links":{"outbound_url":"https://hdl.handle.net/20.500.14658/7814","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Beaudoin, Normand","Gauvin, Serge"]},{"key":"dc:creator","label":"Author","values":["Cyr, Richard"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2024-12-20T18:07:53Z","2025-05-13T20:03:36Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2024-12-20T18:07:53Z","2025-05-13T20:03:36Z"]},{"key":"dc:date.issued","label":"Date","values":["2011"]},{"key":"dc:publisher","label":"Institution","values":["Université de Moncton"]},{"key":"dc:type","label":"Dc Type","values":["Text","thèse"]},{"key":"thesis:degree_discipline","label":"Discipline","values":["Faculté des sciences"]},{"key":"thesis:degree_level","label":"Degree Level","values":["2e cycle"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Maîtrise ès sciences (physique)"]},{"key":"thesis:institution_name","label":"Thesis Institution Name","values":["Université de Moncton"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Spectroscopie optique","Polarisation (Lumière)","Optique","Instruments","Ellipsométrie","Mesures optiques","Semi-conducteurs","Essais","Méthodes optiques","Couches minces"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language","label":"Dc Language","values":["fre"]},{"key":"dc:language.iso","label":"Language (ISO)","values":["iso639-2b"]},{"key":"dc:rights","label":"Dc Rights","values":["Author"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["oclc: 799231851"]},{"key":"dc:identifier.other","label":"Dc Identifier Other","values":["umir:1415"]},{"key":"dc:identifier.uri","label":"Identifier URI","values":["https://hdl.handle.net/20.500.14658/7814"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":[""L'objectif de cette thèse est de développer et des tester diverses méthodes de correction permettant de corriger numériques les spectres optiques obtenus avec l'ellipsomètre de fabrication locale."-- f. 4"]},{"key":"dc:format","label":"Dc Format","values":["application/pdf"]},{"key":"dc:format.medium","label":"Dc Format Medium","values":["electronic"]},{"key":"dc:title","label":"Title","values":["Investigation de la déformation spectrale d'un appareil optique à irradiation polychromatique"]}]}],"canonical_facts":{"dc:contributor.advisor":["Beaudoin, Normand","Gauvin, Serge"],"dc:creator":["Cyr, Richard"],"dc:date.accessioned":["2024-12-20T18:07:53Z","2025-05-13T20:03:36Z"],"dc:date.available":["2024-12-20T18:07:53Z","2025-05-13T20:03:36Z"],"dc:date.issued":["2011"],"dc:description.abstract":[""L'objectif de cette thèse est de développer et des tester diverses méthodes de correction permettant de corriger numériques les spectres optiques obtenus avec l'ellipsomètre de fabrication locale."-- f. 4"],"dc:format":["application/pdf"],"dc:format.medium":["electronic"],"dc:identifier":["oclc: 799231851"],"dc:identifier.other":["umir:1415"],"dc:identifier.uri":["https://hdl.handle.net/20.500.14658/7814"],"dc:language":["fre"],"dc:language.iso":["iso639-2b"],"dc:publisher":["Université de Moncton"],"dc:rights":["Author"],"dc:subject":["Spectroscopie optique","Polarisation (Lumière)","Optique","Instruments","Ellipsométrie","Mesures optiques","Semi-conducteurs","Essais","Méthodes optiques","Couches minces"],"dc:title":["Investigation de la déformation spectrale d'un appareil optique à irradiation polychromatique"],"dc:type":["Text","thèse"],"thesis:degree_discipline":["Faculté des sciences"],"thesis:degree_level":["2e cycle"],"thesis:degree_name":["Maîtrise ès sciences (physique)"],"thesis:institution_name":["Université de Moncton"]},"updated_at":"2026-07-24T03:10:09Z"}