{"id":{"repo_id":"mo-state","oai_identifier":"oai:bearworks.missouristate.edu:theses-1843"},"canonical_url":"https://search.dev.ndltd.org/etd/mo-state/oai:bearworks.missouristate.edu:theses-1843","repository":{"repo_id":"mo-state","name":"Missouri State University","base_url":"https://bearworks.missouristate.edu/do/oai/"},"display":{"title":"Electrodeposition and Characterization of Copper Oxide Thin Films","abstract":"Cuprous oxide is a low cost semiconductor with applications in solar energy conversion and oxygen sensing devices. Fabrication of these films by electrodeposition offers a simple and cost effective method for producing large-area thin films in mass quantities. An interesting phenomenon associated with this material is the variation of the conduction type with fabrication technique and/or annealing conditions. This study investigates cupper oxide films grown on Indium Tin Ocide (ITO) coated glass substrates via reduction of Copper (II) Lactate at room temperature. Current- Voltage (I-V) characterization is used as well as x-ray diffraction (XRD), scanning electron microscopy (SEM) and temperature dependant resistance in the analysis of selected films. The construction of the equipment used to produce these films is also discussed. Both a constant current source and constant voltage source have been built and are controlled from a data acquisition board (CIO-DAS1600) installed in a desktop computer. The data acquisition board is controlled by a program created in LabVIEW.","abstract_html":"Cuprous oxide is a low cost semiconductor with applications in solar energy conversion and oxygen sensing devices. Fabrication of these films by electrodeposition offers a simple and cost effective method for producing large-area thin films in mass quantities. An interesting phenomenon associated with this material is the variation of the conduction type with fabrication technique and/or annealing conditions. This study investigates cupper oxide films grown on Indium Tin Ocide (ITO) coated glass substrates via reduction of Copper (II) Lactate at room temperature. Current- Voltage (I-V) characterization is used as well as x-ray diffraction (XRD), scanning electron microscopy (SEM) and temperature dependant resistance in the analysis of selected films. The construction of the equipment used to produce these films is also discussed. Both a constant current source and constant voltage source have been built and are controlled from a data acquisition board (CIO-DAS1600) installed in a desktop computer. The data acquisition board is controlled by a program created in LabVIEW.","abstract_has_math":false,"creators":["Bogatko, Stuart"],"institution":null,"degree_name":"Master of Science in Materials Science","degree_level":"Masters","degree_discipline":"Physics, Astronomy, and Materials Science","degree_department":null,"school":null,"contributors":["Robert Mayanovic"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":2002,"date_issued":"2002-07-01T07:00:00Z","date_published":"2002-07-01T07:00:00Z","updated_at":"2026-07-24T03:15:54Z","subjects":["Materials Science and Engineering"],"languages":[],"rights":["© Stuart Bogatko"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://bearworks.missouristate.edu/theses/842","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Robert Mayanovic"]},{"key":"dc:creator","label":"Author","values":["Bogatko, Stuart"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"thesis:degree_discipline","label":"Discipline","values":["Physics, Astronomy, and Materials Science"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science in Materials Science"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Materials Science and Engineering"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:rights","label":"Dc Rights","values":["© Stuart Bogatko"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://bearworks.missouristate.edu/theses/842"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["Cuprous oxide is a low cost semiconductor with applications in solar energy conversion and oxygen sensing devices. Fabrication of these films by electrodeposition offers a simple and cost effective method for producing large-area thin films in mass quantities. An interesting phenomenon associated with this material is the variation of the conduction type with fabrication technique and/or annealing conditions. This study investigates cupper oxide films grown on Indium Tin Ocide (ITO) coated glass substrates via reduction of Copper (II) Lactate at room temperature. Current- Voltage (I-V) characterization is used as well as x-ray diffraction (XRD), scanning electron microscopy (SEM) and temperature dependant resistance in the analysis of selected films. The construction of the equipment used to produce these films is also discussed. Both a constant current source and constant voltage source have been built and are controlled from a data acquisition board (CIO-DAS1600) installed in a desktop computer. The data acquisition board is controlled by a program created in LabVIEW."]},{"key":"dc:title","label":"Title","values":["Electrodeposition and Characterization of Copper Oxide Thin Films"]}]}],"canonical_facts":{"dc:contributor":["Robert Mayanovic"],"dc:creator":["Bogatko, Stuart"],"dc:description.abstract":["Cuprous oxide is a low cost semiconductor with applications in solar energy conversion and oxygen sensing devices. Fabrication of these films by electrodeposition offers a simple and cost effective method for producing large-area thin films in mass quantities. An interesting phenomenon associated with this material is the variation of the conduction type with fabrication technique and/or annealing conditions. This study investigates cupper oxide films grown on Indium Tin Ocide (ITO) coated glass substrates via reduction of Copper (II) Lactate at room temperature. Current- Voltage (I-V) characterization is used as well as x-ray diffraction (XRD), scanning electron microscopy (SEM) and temperature dependant resistance in the analysis of selected films. The construction of the equipment used to produce these films is also discussed. Both a constant current source and constant voltage source have been built and are controlled from a data acquisition board (CIO-DAS1600) installed in a desktop computer. The data acquisition board is controlled by a program created in LabVIEW."],"dc:identifier":["https://bearworks.missouristate.edu/theses/842"],"dc:rights":["© Stuart Bogatko"],"dc:subject":["Materials Science and Engineering"],"dc:title":["Electrodeposition and Characterization of Copper Oxide Thin Films"],"thesis:degree_discipline":["Physics, Astronomy, and Materials Science"],"thesis:degree_level":["Masters"],"thesis:degree_name":["Master of Science in Materials Science"]},"updated_at":"2026-07-24T03:15:54Z"}