{"id":{"repo_id":"mo-state","oai_identifier":"oai:bearworks.missouristate.edu:theses-1839"},"canonical_url":"https://search.dev.ndltd.org/etd/mo-state/oai:bearworks.missouristate.edu:theses-1839","repository":{"repo_id":"mo-state","name":"Missouri State University","base_url":"https://bearworks.missouristate.edu/do/oai/"},"display":{"title":"Photoreflectance and Its Application to Semiconductor Characterization","abstract":"A photoreflectance measurement system has been designed and implemented. The system provides a sensitive, accurate, and nondestructive means for the study and characterization of semiconductors. The system includes a microcontroller-based servomechanism to drive a variable neutral density filter for signal normalization. System performance under different conditions has been investigated. The methods to suppress the noise in the measurement are examined. The prototype system has been successfully applied to the characterization of CdTe, semi-insulating GaAs, and GaAs thin films grown on semi-insulating GaAs and Si-doped GaAs in the molecular beam eptaxial system.","abstract_html":"A photoreflectance measurement system has been designed and implemented. The system provides a sensitive, accurate, and nondestructive means for the study and characterization of semiconductors. The system includes a microcontroller-based servomechanism to drive a variable neutral density filter for signal normalization. System performance under different conditions has been investigated. The methods to suppress the noise in the measurement are examined. The prototype system has been successfully applied to the characterization of CdTe, semi-insulating GaAs, and GaAs thin films grown on semi-insulating GaAs and Si-doped GaAs in the molecular beam eptaxial system.","abstract_has_math":false,"creators":["Lin, Jianrong"],"institution":null,"degree_name":"Master of Science in Materials Science","degree_level":"Masters","degree_discipline":"Physics, Astronomy, and Materials Science","degree_department":null,"school":null,"contributors":["Shyang Hwang"],"advisors":[],"committee_chairs":[],"committee_members":[],"year":1998,"date_issued":"1998-12-01T08:00:00Z","date_published":"1998-12-01T08:00:00Z","updated_at":"2026-07-24T03:15:54Z","subjects":["Materials Science and Engineering"],"languages":[],"rights":["© Jianrong Lin"],"rights_urls":[],"identifier_entries":[]},"links":{"outbound_url":"https://bearworks.missouristate.edu/theses/838","outbound_label":"Repository record","outbound_source":"dc:identifier"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor","label":"Contributor","values":["Shyang Hwang"]},{"key":"dc:creator","label":"Author","values":["Lin, Jianrong"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"thesis:degree_discipline","label":"Discipline","values":["Physics, Astronomy, and Materials Science"]},{"key":"thesis:degree_level","label":"Degree Level","values":["Masters"]},{"key":"thesis:degree_name","label":"Degree Name","values":["Master of Science in Materials Science"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Materials Science and Engineering"]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:rights","label":"Dc Rights","values":["© Jianrong Lin"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier","label":"Identifier","values":["https://bearworks.missouristate.edu/theses/838"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description.abstract","label":"Abstract","values":["A photoreflectance measurement system has been designed and implemented. The system provides a sensitive, accurate, and nondestructive means for the study and characterization of semiconductors. The system includes a microcontroller-based servomechanism to drive a variable neutral density filter for signal normalization. System performance under different conditions has been investigated. The methods to suppress the noise in the measurement are examined. The prototype system has been successfully applied to the characterization of CdTe, semi-insulating GaAs, and GaAs thin films grown on semi-insulating GaAs and Si-doped GaAs in the molecular beam eptaxial system."]},{"key":"dc:title","label":"Title","values":["Photoreflectance and Its Application to Semiconductor Characterization"]}]}],"canonical_facts":{"dc:contributor":["Shyang Hwang"],"dc:creator":["Lin, Jianrong"],"dc:description.abstract":["A photoreflectance measurement system has been designed and implemented. The system provides a sensitive, accurate, and nondestructive means for the study and characterization of semiconductors. The system includes a microcontroller-based servomechanism to drive a variable neutral density filter for signal normalization. System performance under different conditions has been investigated. The methods to suppress the noise in the measurement are examined. The prototype system has been successfully applied to the characterization of CdTe, semi-insulating GaAs, and GaAs thin films grown on semi-insulating GaAs and Si-doped GaAs in the molecular beam eptaxial system."],"dc:identifier":["https://bearworks.missouristate.edu/theses/838"],"dc:rights":["© Jianrong Lin"],"dc:subject":["Materials Science and Engineering"],"dc:title":["Photoreflectance and Its Application to Semiconductor Characterization"],"thesis:degree_discipline":["Physics, Astronomy, and Materials Science"],"thesis:degree_level":["Masters"],"thesis:degree_name":["Master of Science in Materials Science"]},"updated_at":"2026-07-24T03:15:54Z"}