Efficient IC statistical modeling and extraction using a Bayesian inference framework

Variability modeling and extraction in advanced process technologies is a key challenge to ensure robust circuit performance as well as high manufacturing yield. In this thesis, we present an ecient framework for device and circuit variability modeling and extraction by combining an ultra-compact transistor model, called the MIT virtual source (MVS) model, and a Bayesian extraction method. Based on statistical formulations extended from the MVS model, we propose algorithms for three applications that greatly reduce time and cost required for measurement of on-chip test structures and characterization of library cells. We start with a novel DC and transient parameter extraction methodology for the MVS model and achieve a quantitative match with industry standard models for output characteristics of MOS transistor devices. We develop a physically based statistical MVS model extension and a corresponding statistical extraction technique based on the backward propagation of variance (BPV). The resulting statistical MVS model is validated using Monte Carlo simulations, and the statistical distributions of several gures of merit for logic and memory cells are compared with those of a 40-nm CMOS industrial design kit. A critical problem in design for manufacturability (DFM) is to build statistically valid prediction models of circuit performance based on a small number of measurements taken from a mixture of on-chip test structures. Towards this goal, we propose a technique named physical subspace projection to transfer a mixture of measurements into a unique probability space spanned by MVS parameters. We search over MVS parameter combinations to nd those with the maximum probability by extending the expectation-maximization (EM) algorithm and iteratively solve the maximum a posteriori (MAP) estimation problem. Finally, we develop a process shift calibration technique to estimate circuit performance by combining SPICE simulation and very few new measurements. We further develop a parameter extraction algorithm to accurately extract all current-voltage (I - V ) parameters given limited and incomplete I - V measurements, applicable to early technology evaluation and statistical parameter extraction. An important step in this method is the use of MAP estimation where past measurements of transistors from various technologies are used to learn a prior distribution and its uncertainty matrix for the parameters of the target technology. We then utilize Bayesian inference to facilitate extraction and posterior estimates for the target technologies using a very small set of additional measurements. Finally, we develop a novel flow to enable computationally efficient statistical characterization of delay and slew in standard cell libraries. We first propose a novel ultra-compact, analytical model for gate timing characterization. Next, instead of exploiting the sparsity of the regression coefficients of the process space with a reduced process sample size, we exploit correlations between dierent cell variables (design and input conditions) by a Bayesian learning algorithm to estimate the parameters of the aforementioned timing model using past library characterizations along with a very small set of additional simulations.

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2015

Author dc:creator

• Yu, Li, Ph. D. Massachusetts Institute of Technology

Advisor dc:contributor.advisor

• Duane S. Boning and Duane S. Boning.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/99786

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/99786