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Massachusetts Institute of Technology

Micromechanics of the through-thickness deformation of paperboard

Abstract

dc:description.abstract

An experimental investigation of the behavior of paperboard has been performed, focusing on the identification of the mechanisms of through-thickness deformation. Experiments have been conducted at the microscopic and macroscopic levels, the difference between the two being the length scale. Experiments at the microscopic level were performed in a scanning electron microscope, allowing concurrent viewing of the deformation as it took place with acquisition of load vs. displacement data. The experiments at the macroscopic level confirm the mechanisms observed at the microscopic level and provide more accurate, continuum-level stress-strain data. The motivation for the investigation is the modeling of the creasing process, in which a sheet of paperboard is punched and folded along a narrow line to create a corner for packaging. Creasing experiments indicate that out-of-plane shear damage during punching and normal delamination during folding govern the quality of the resulting crease. Experiments in out-of-plane tension, compression, and simple shear have been performed to investigate the behavior of paperboard under these simple loading conditions. The results show that normal and tangential delamination at the interfaces between layers is of extreme importance in the behavior of paperboard in tension and shear. Damage in the form of micro cracks occurs almost from the onset of strain and culminates in large-scale delamination coincident with a large decrease in the strength of the material. In compression, the behavior is mostly elastic and is governed by densification of the material. The brief initial stages of deformation involve plastic elimination of voids. This is followed by non-linear elastic stiffening of the material via densification.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
1999

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Smith, Carmen Alexis
Advisor dc:contributor.advisor
  • Mary C. Boyce and David M. Parks.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/9426
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/9426

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Smith, Carmen Alexis. Micromechanics of the through-thickness deformation of paperboard. Massachusetts Institute of Technology, 1999. http://hdl.handle.net/1721.1/9426