Massachusetts Institute of Technology
Interferometric photomechanical spectroscopy and imaging of biological and turbid media
Abstract
dc:description.abstractThe medical field is currently experiencing rapid growth in the area of optical diagnostics. Minimally-invasive spectroscopic and imaging modalities enable physicians to make increasingly accurate diagnoses in real time, without the cost and delay associated with traditional reliance on histopathology. We have developed an ultra-high resolution interferometric system which is well suited for clinical diagnostic applications. The interferometric system has a spatial resolution of 0.1 nm and a temporal resolution of 3 ns. We have utilized this high resolution interferometric system in two novel minimally invasive techniques. Both techniques measure surface deformation of a target after absorption of a short laser pulse. The time dependent surface deformation is a function of the target's spatially resolved optical, thermal and mechanical properties. Therefore, accurate measurement of surface displacement can be used to extract significant diagnostic information. The first technique is termed Interferometric Photomechanical Spectroscopy (IPMS), and is used to measure effective optical absorption depth of a sample. We used IPMS to measure effective absorption depth of both diffuse and speculary reflecting targets including well characterized colored glass samples and gelatin based tissue phantoms.
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Department of Mechanical Engineering.
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 2001
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Payne, Barry
- Advisor dc:contributor.advisor
-
- B.B. Mikic and N.S. Nishioka.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/89303
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/89303