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Massachusetts Institute of Technology

Investigation of sub-bandgap absorption in iron pyrite : optical and electrical measurements

Abstract

dc:description.abstract

We investigate sub-bandgap absorption in pyrite FeS₂ single-crystals, using both natural and synthetic crystals. Both types of crystals show non-negligible magnitudes of sub-bandgap absorption. To test whether the origin of the residual sub-bandgap absorption is partially due to a lower bulk bandgap than previously thought, we conduct temperature-dependent electrical measurements on natural and synthetic crystals. Unlike previous measurements on pyrite, our electrical measurements are done in a sulfur atmosphere to avoid FeS formation. Using conductivity data in the intrinsic regime along with extrapolated Hall mobility data, the extracted bandgap is more than 0.1 eV lower than the literature value of 0.95 eV. However, higher-temperature Hall data are needed to gain a more reliable bandgap estimate.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Mechanical Engineering.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2014

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Chakraborty, Rupak
Advisor dc:contributor.advisor
  • Tonio Buonassisi.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/87956
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/87956

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Chakraborty, Rupak. Investigation of sub-bandgap absorption in iron pyrite : optical and electrical measurements. Massachusetts Institute of Technology, 2014. http://hdl.handle.net/1721.1/87956