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Massachusetts Institute of Technology

Design method of a modular electronic printed circuit board testing system

Abstract

dc:description.abstract

The failure rate of the printed circuit board electronic testing process is higher than acceptable at a Lenze Americas factory. This thesis will understand the root causes of failure, and use system engineering methods to decide what course of action should be taken. A Tradespace analysis is used to help decompose some of the complexity into a visualization that simplifies the decision process. The Tradespace analysis suggests that more utility can be achieved by upgrading the design of existing test fixtures versus purchasing off of the shelf solutions. The second phase will identify a design concept, offer specific design solutions, and finally a fully designed system that is capable of improving the performance of the test fixtures in electronic board test area by 50%. The system is then upgradable with in-line conveyors to run autonomously decoupling the operator from the process.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Mechanical Engineering.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2013

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • McCalib, David, Jr
Advisor dc:contributor.advisor
  • Stanley B. Gershwin.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/85790
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/85790

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

McCalib, David, Jr. Design method of a modular electronic printed circuit board testing system. Massachusetts Institute of Technology, 2013. http://hdl.handle.net/1721.1/85790