A method for infrared temperature measurements of thin film materials with a low, unknown, and/or variable emissivity at low temperatures

Accurate non-contact temperature measurements of objects using thermal radiation is often limited by low emission of IR radiation because of low temperatures and/or emissivities, or by the unknown or changing emissivity of the material being measured. This thesis covers an effort to build a practical, inexpensive, and widely applicable non-contact system for accurately measuring the temperatures of materials of low, unknown, and/or variable emissivity. The method to be used is intended specifically for those objects at low temperatures (below 100 degrees Celsius), which are conventionally the most difficult to accurately measure.

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Mechanical Engineering.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2013

Author dc:creator

• Jarboe, Jason Neal

Advisor dc:contributor.advisor

• Alexander H. Slocum.

• Mechanical Engineering.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/84401

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/84401