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Massachusetts Institute of Technology

A study of CMOS technologies for image sensor applications

Abstract

dc:description.abstract

CMOS (Complementary Metal-Oxide-Silicon) imager technology, as compared with mature CCD (Charge-Coupled Device) imager technology, has the advantages of higher circuit integration, lower power consumption, and potentially lower price. The advantages make this technology competent for the next-generation solid-state imaging applications. However, CMOS processes are originally developed for high-performance digital circuits. Fabricating high-quality embedded image sensors with CMOS technologies is not a straightforward task. This motivates the study of CMOS technologies for imaging applications presented in this thesis. The major content of this study can be partitioned into four parts: (a) A two-stage characterization methodology is developed for sensor optimization, including the characterization of large-area photodiodes and comparative analyses on small-dimension sensor arrays with various pixel structures, junction types of the sensors, and other process-related conditions. (b) The mechanism of hot-carrier induced excess minority carriers occurred at the in-pixel transistors is identified and investigated. The influence of the excess carriers on imager performance is analyzed. Suggestions on the pixel design are provided. (c) Signal cross-talk between adjacent pixels is quantified and studied using a sensor array with a specially designed metal shield pattern, which exposes the center pixel and covers the others. The influence of cross-talk on color imager performance is analyzed. Process and layout improvements on cross-talk are also proposed. (d) The trend of pixel size reduction is investigated from the perspective of the achievable optical lens resolution. Using the modulation transfer function (MTF) as an index, optical simulations are performed to examine the relation between the lens resolution and the lens complexity.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2001

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Wang, Ching-Chun, 1969-
Advisor dc:contributor.advisor
  • Charles G. Sodini.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/8214
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/8214

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Wang, Ching-Chun, 1969-. A study of CMOS technologies for image sensor applications. Massachusetts Institute of Technology, 2001. http://hdl.handle.net/1721.1/8214