Massachusetts Institute of Technology
Shuttling of ions for characterization of a microfabricated ion trap
Abstract
dc:description.abstractIn this thesis, I present experimental results demonstrating the characterization of a planar Paul trap. I discuss the theory of ion trapping and analyze the voltages required for shuttling. Next, the characteristics of a digital-to-analog converter (DAC) are calibrated, and this instrument is integrated into trapping experiments to test the viability of the analytic model. Combining theory with the capabilities of the DAC, I calculate that the new experimental system is capable of 3 nm-precision control of the ion. Taking advantage of this ion control, I present initial results for a lock-in micromotion detection method which minimizes stray fields around an ⁸⁸Sr+ ion using Fourier analysis on the ion fluorescence to detect resonance at the secular frequencies. This method drives the ion oscillator across resonance using a superimposed radiofrequency electric field, which allows for off-axis field measurements as well as trap characterization. With this method, the secular frequencies of the trap are measured and are observed to fall within 3.50[sigma] of the analytic prediction.
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Department of Physics.
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 2012
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Fisher, Zachary (Zachary Kenneth)
- Advisor dc:contributor.advisor
-
- Isaac L. Chuang.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/78510
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/78510