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Massachusetts Institute of Technology

Resonant photonic crystal photodetectors for the infrared in silicon

Abstract

dc:description.abstract

The challenge of overcoming energy efficiency and bandwidth limitations in interconnects between components in computer systems (e.g. between memory and processors) has motivated the development of short-range optical interconnects, which in many approaches require optical devices and waveguides fabricated within the same CMOS environments as the electronics. This thesis centers on developing photodetectors for infrared light within the silicon of commercial CMOS processes; silicon's lack of strong absorption at the wavelengths of interest makes this challenging. The approach uses defect-state mediated linear absorption and two-photon absorption (TPA) in small mode-volume resonators to generate photocarriers. Such resonators allow efficient linear absorption in short devices despite low absorption coefficients, and a greater TPA rate than in bulk material due to the large energy densities achievable. The devices here are made in the polysilicon layer of a commercial DRAM process, and characterization of this material, different from crystalline Si in both its linear and nonlinear absorption, forms a starting point. The design, fabrication, and testing of electrically addressable photonic crystal resonators subject to the constraints associated with working in a CMOS process are then presented. The best resonators made were able to reach Qs of 70,000, limited by linear loss in the polysilicon. Linear absorption is dominant in the devices made to date, and allowed quantum efficiencies of a few tens of percent on resonance. However, high biases of around -20 V were required to achieve these QEs, and the bandwidth of the devices was limited to only approximately 500 MHz. Improvements to the electrical structure of the devices are likely to improve these characteristics. The ability to fabricate high-Q photonic crystal resonators within full CMOS flows, and the QEs allowed by defect-assisted absorption in the devices measured, indicate promise for this approach to photodetection in integrated CMOS photonic systems.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2012

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Mehta, Karan K. (Karan Kartik)
Advisor dc:contributor.advisor
  • Rajeev J. Ram.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/78369
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/78369

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Mehta, Karan K. (Karan Kartik). Resonant photonic crystal photodetectors for the infrared in silicon. Massachusetts Institute of Technology, 2012. http://hdl.handle.net/1721.1/78369