Statistical control and experimental design for edge bead reduction in laminating process

Edge bead formation is a well-known phenomenon typically happening in the lamination due to the physics of this process. It causes the defect of high edge observed in the carton roll after the laminated carton sheets are wrapped around the roller in Company X; the affected carton sheets can no longer be fed into customers' filling machines due to the uneven surface. To address this problem, a model with process parameters and quality characteristics was built to define the lamination. Based on this model, the capability of measurement system was verified and current process capability was calculated. After that, Shewhart control charts were employed to identify the assignable causes and to bring the process to in-control state. Then, a designed experiment was conducted to find the optimal operating conditions. It was found that line speed, screw speed, die-bolt power and die-lip build-up are most likely to be subject to disturbances. In addition, diebolt power, manifold plug and deckle blade have a statistically significant impact on the edge bead formation. As a result, an out-of-control-action plan was proposed and a recipe is recommended for edge bead reduction in laminating process.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Mechanical Engineering.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2010

Author dc:creator

• Fan, Huangjia (Francis Huangjia)

Advisor dc:contributor.advisor

• David E. Hardt.

• Mechanical Engineering.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/62540

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/62540