Massachusetts Institute of Technology
Business process analysis of yield data flow at a newly merged pharmaceutical company
Abstract
dc:description.abstractTracking, monitoring, and documentation of the manufacturing performance are significant for pharmaceutical companies under the regulations of Food and Drug Administration (FDA). However, the current yield data are not consistent and the business procedures for yield data flow are not unified and optimized at the newly merged pharmaceutical company SJP Singapore. Therefore, a systematic analysis of the current yield data processing was performed in four facilities located at two campuses of this company. Through this analysis, the current business procedures were visualized; the various yield concepts were clearly defined; the problems involved and their root causes were identified; the potential solutions were proposed; and a standard business process was developed taking into account the situation of each facility. As a result, the inconsistent yield data were harmonized and procedures in all four facilities were unified and standardized. This revised business process would enable each department to better fulfill its responsibilities and drive decisions on future improvements.
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Dept. of Mechanical Engineering.
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 2010
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Jiang, Nan, M. Eng. Massachusetts Institute of Technology
- Advisor dc:contributor.advisor
-
- Stanley B. Gershwin.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/62500
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/62500