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Massachusetts Institute of Technology

Quality improvement and control based on defect reduction

Abstract

dc:description.abstract

This thesis addresses the quality improvement in a printing process at a food packaging company now experiencing hundreds of printing defects. Methodologies of Define, Measure, Analyze, Improve, and Control (DMAIC), and Response Surface Model were introduced to reduce the defect rate and control the process. As a result, critical inputs were identified, and a statistical regression model was constructed to predict the flaw size by knowing the critical inputs of the process. The mathematical optimal settings were determined to minimize the flaw size. Moreover, advanced control charts were developed to monitor and control the process.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Mechanical Engineering.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2010

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Dai, Qi, M. Eng. Massachusetts Institute of Technology
Advisor dc:contributor.advisor
  • David E. Hardt.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/62497
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/62497

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Dai, Qi, M. Eng. Massachusetts Institute of Technology. Quality improvement and control based on defect reduction. Massachusetts Institute of Technology, 2010. http://hdl.handle.net/1721.1/62497