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Massachusetts Institute of Technology

Correlations in firm default behavior

Abstract

dc:description.abstract

Modeling credit risk using Structural and Reduced Form models has been a popular and apropos topic of research. This work makes an attempt to better understand correlations in firm default. A review of contemporary research reveals several models with varying degrees of assumptions around firm default and how they relate to macroeconomic variables. More recent literature also makes use of a doubly stochastic assumption which in essence holds that given a certain path of covariates the default probabilities of two similar firms is independent. We explore empirical evidence which points to correlated defaults conditional on various explanatory covariates. Given the strong similarities in underlying firm structure and relationship to macro-economic environment, it can be hypothesized that there exist correlations in default behavior among similar firms.

Degree

thesis:*
Department dc:contributor.department
System Design and Management Program.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2009

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Thirukkonda, Sreeram (Sreeram Radhakrishnan), 1975-
Advisor dc:contributor.advisor
  • Scott Joslin.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/55245
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/55245

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Thirukkonda, Sreeram (Sreeram Radhakrishnan), 1975-. Correlations in firm default behavior. Massachusetts Institute of Technology, 2009. http://hdl.handle.net/1721.1/55245