{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/55122"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/55122","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"High-speed modulation of resonant CMOS photonic modulators in deep-submicron bulk-CMOS","abstract":"Processor manufacturers have turned to parallelism to continue to improve processor performance, and the bandwidth demands of these systems have risen. Silicon photonics can lower the energy-per-bit of core-to-core and core-to-memory interconnects to help alleviate bandwidth bottlenecks. In this thesis, methods of controlling the amount of charge entering the PiN-diode structure of a photonic ring modulator are investigated to achieve high energy-efficiency in a constrained monolithic process. A digital modulator driver circuit is designed, simulated, fabricated and partially tested. This circuit uses a push-pull topology with pre emphasis to reduce the energy per bit and to prevent the ring's optical passband from shifting to the next optical channel. A flexible driver test circuit for in-situ device characterization has been developed with a device-to-circuit modeling framework. There are many tradeoffs that must be analyzed from the system, circuit, and device levels.","abstract_html":"Processor manufacturers have turned to parallelism to continue to improve processor performance, and the bandwidth demands of these systems have risen. Silicon photonics can lower the energy-per-bit of core-to-core and core-to-memory interconnects to help alleviate bandwidth bottlenecks. In this thesis, methods of controlling the amount of charge entering the PiN-diode structure of a photonic ring modulator are investigated to achieve high energy-efficiency in a constrained monolithic process. A digital modulator driver circuit is designed, simulated, fabricated and partially tested. This circuit uses a push-pull topology with pre emphasis to reduce the energy per bit and to prevent the ring's optical passband from shifting to the next optical channel. A flexible driver test circuit for in-situ device characterization has been developed with a device-to-circuit modeling framework. There are many tradeoffs that must be analyzed from the system, circuit, and device levels.","abstract_has_math":false,"creators":["Moss, Benjamin (Benjamin Roy)"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.","school":null,"contributors":[],"advisors":["Vladimir Stojanović."],"committee_chairs":[],"committee_members":[],"year":2009,"date_issued":"2009","date_published":"2009","updated_at":"2026-07-22T22:22:20Z","subjects":["Electrical Engineering and Computer Science."],"languages":["eng"],"rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. 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A digital modulator driver circuit is designed, simulated, fabricated and partially tested. This circuit uses a push-pull topology with pre emphasis to reduce the energy per bit and to prevent the ring's optical passband from shifting to the next optical channel. A flexible driver test circuit for in-situ device characterization has been developed with a device-to-circuit modeling framework. There are many tradeoffs that must be analyzed from the system, circuit, and device levels."],"dc:description.degree":["S.M."],"dc:identifier.uri":["http://hdl.handle.net/1721.1/55122"],"dc:language.iso":["eng"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. 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