Back to results

Massachusetts Institute of Technology

Managing conflict across generations in the workplace

Abstract

dc:description.abstract

The current American workplace is made up of members of four distinct generations: "Veterans" (born between 1922-1943), "Boomers" (born between 1943-1960), "Generation X" (born between 1960 - 1980), and "Generation Y" (born between 1980 and 2000). Members of each generation bring to the workplace very distinct assumptions regarding technology, expertise, and rewards. This thesis explores the nature of differences in assumptions across all four generations. It takes the two most relevant to the current work environment, Boomers and Generation Y, and analyzes how their different approaches to technology, expertise and rewards cause conflict in the workplace. After conducting a literature review on conflict and change management at work, I propose a process for preventing and mitigating generational conflict at work.

Degree

thesis:*
Department dc:contributor.department
Sloan School of Management.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2009

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Vázquez, Ernesto (Vázquez-Sáenez)
Advisor dc:contributor.advisor
  • John Van Maanen.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/50103
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/50103

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Vázquez, Ernesto (Vázquez-Sáenez). Managing conflict across generations in the workplace. Massachusetts Institute of Technology, 2009. http://hdl.handle.net/1721.1/50103