Massachusetts Institute of Technology
Molecular and quantum dot floating gate non-volatile memories
Abstract
dc:description.abstractConventional Flash memory devices face a scaling issue that will impede memory scaling beyond the 50nm node: a reliability issue involving the tunneling oxide thickness and charge retention. A possible solution is to replace the continuous floating gate, where charge is stored, with a segmented charge storage film, so that leakage through defects in the tunneling oxide would be localized. We first explored using quantum dots as possible floating gate replacements. After conducting simulations, we established the need for the smallest possible segmented structures. This led us to the use of molecular films as floating gates in non-volatile flash memories. As an example, a single organic molecule of 3,4,9,10 -parylene tetracarboxylic dianhydride (PTCDA) occupies lnm2 in area and is capable of storing and retaining a single charge. If a defect is present in the tunneling oxide below the floating gate, only a few molecules of PTCDA would be affected due to poor lateral conduction between PTCDA molecules. We can, therefore, project that such molecular thin films of PTCDA are likely to meet demanding size and packing density requirements of advancing flash memory technology.
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 2008
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Abdu, Hassen
- Advisor dc:contributor.advisor
-
- Vladimir Bulovic.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/45827
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/45827