{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/43607"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/43607","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"A low power digitizer for precision carrier band measurements","abstract":"It has been found that the amplitude of the 20kHz harmonic at the output of a particular third order [Sigma][Delta] analog to digital converter drifts significantly as the temperature fluctuates. In this document, both methods of ascertaining the source of this drift and ways to reduce it are discussed. First, the settling time of the circuit is explored by analyzing the design of the transmission gates used to implement the switched capacitor integrators in the [Sigma][Delta]. Next, the effects of op amp transistor mismatch is considered via simulations which introduce small random offsets to the widths and lengths in the transistors of each op amp. Finally, a calibration scheme which can be used to eliminate the AC gain variation of the [Sigma][Delta] at 20kHz is analyzed, and simulation results of the circuit used to perform the calibration are portrayed.","abstract_html":"It has been found that the amplitude of the 20kHz harmonic at the output of a particular third order [Sigma][Delta] analog to digital converter drifts significantly as the temperature fluctuates. In this document, both methods of ascertaining the source of this drift and ways to reduce it are discussed. First, the settling time of the circuit is explored by analyzing the design of the transmission gates used to implement the switched capacitor integrators in the [Sigma][Delta]. Next, the effects of op amp transistor mismatch is considered via simulations which introduce small random offsets to the widths and lengths in the transistors of each op amp. Finally, a calibration scheme which can be used to eliminate the AC gain variation of the [Sigma][Delta] at 20kHz is analyzed, and simulation results of the circuit used to perform the calibration are portrayed.","abstract_has_math":false,"creators":["Santarelli, Keith R. (Keith Robert), 1977-"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.","school":null,"contributors":[],"advisors":["James K. Roberge and Edmund J. Balboni."],"committee_chairs":[],"committee_members":[],"year":2000,"date_issued":"2000","date_published":"2000","updated_at":"2026-07-22T22:20:48Z","subjects":["Electrical Engineering and Computer Science."],"languages":["eng"],"rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"rights_urls":["http://dspace.mit.edu/handle/1721.1/7582"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/1721.1/43607","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["James K. Roberge and Edmund J. Balboni."]},{"key":"dc:contributor.department","label":"Department","values":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."]},{"key":"dc:contributor.other","label":"Dc Contributor Other","values":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."]},{"key":"dc:creator","label":"Author","values":["Santarelli, Keith R. (Keith Robert), 1977-"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2008-11-07T20:17:18Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2008-11-07T20:17:18Z"]},{"key":"dc:date.issued","label":"Date","values":["2000"]},{"key":"dc:publisher","label":"Institution","values":["Massachusetts Institute of Technology"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Electrical Engineering and Computer Science."]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://dspace.mit.edu/handle/1721.1/7582"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/1721.1/43607"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.","Includes bibliographical references (leaves 77-78)."]},{"key":"dc:description.abstract","label":"Abstract","values":["It has been found that the amplitude of the 20kHz harmonic at the output of a particular third order [Sigma][Delta] analog to digital converter drifts significantly as the temperature fluctuates. In this document, both methods of ascertaining the source of this drift and ways to reduce it are discussed. First, the settling time of the circuit is explored by analyzing the design of the transmission gates used to implement the switched capacitor integrators in the [Sigma][Delta]. Next, the effects of op amp transistor mismatch is considered via simulations which introduce small random offsets to the widths and lengths in the transistors of each op amp. Finally, a calibration scheme which can be used to eliminate the AC gain variation of the [Sigma][Delta] at 20kHz is analyzed, and simulation results of the circuit used to perform the calibration are portrayed."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["M.Eng."]},{"key":"dc:title","label":"Title","values":["A low power digitizer for precision carrier band measurements"]}]}],"canonical_facts":{"dc:contributor.advisor":["James K. Roberge and Edmund J. Balboni."],"dc:contributor.department":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:contributor.other":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:creator":["Santarelli, Keith R. (Keith Robert), 1977-"],"dc:date.accessioned":["2008-11-07T20:17:18Z"],"dc:date.available":["2008-11-07T20:17:18Z"],"dc:date.issued":["2000"],"dc:description":["Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.","Includes bibliographical references (leaves 77-78)."],"dc:description.abstract":["It has been found that the amplitude of the 20kHz harmonic at the output of a particular third order [Sigma][Delta] analog to digital converter drifts significantly as the temperature fluctuates. In this document, both methods of ascertaining the source of this drift and ways to reduce it are discussed. First, the settling time of the circuit is explored by analyzing the design of the transmission gates used to implement the switched capacitor integrators in the [Sigma][Delta]. Next, the effects of op amp transistor mismatch is considered via simulations which introduce small random offsets to the widths and lengths in the transistors of each op amp. Finally, a calibration scheme which can be used to eliminate the AC gain variation of the [Sigma][Delta] at 20kHz is analyzed, and simulation results of the circuit used to perform the calibration are portrayed."],"dc:description.degree":["M.Eng."],"dc:identifier.uri":["http://hdl.handle.net/1721.1/43607"],"dc:language.iso":["eng"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"dc:rights.uri":["http://dspace.mit.edu/handle/1721.1/7582"],"dc:subject":["Electrical Engineering and Computer Science."],"dc:title":["A low power digitizer for precision carrier band measurements"],"dc:type":["Thesis"]},"updated_at":"2026-07-22T22:20:48Z"}