{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/41257"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/41257","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"Gradient characterization in magnetic resonance imaging","abstract":"Special magnetic resonance (MR) scans, such as spiral imaging and echo-planar imaging, require speed and gradient accuracy while putting high demands on the MR gradient system that may cause gradient distortion. Additionally, high field MR scans are prone to inhomogeneities that disturb the gradient system. Regardless of the source, gradient characterization provides a simple tool for distortion correction. An improved method, named the self-encoded slice selection algorithm, of characterizing the gradient system of the magnetic resonance system is proposed. It improves and combines the self-encode method and the direct slice selection method. The new approach is simple and fast, and allows for the measurement of waveform gradients that reach the system's limits. The technique is used to model the gradient system as a linear time-invariant transfer function through frequency-domain analysis and time-domain analysis. A transfer function model of the gradient system on the 3T Siemens Tim Trio scanner is presented here along with the characterization and analysis of common waveform gradients. Possible distortion correction approaches are also suggested.","abstract_html":"Special magnetic resonance (MR) scans, such as spiral imaging and echo-planar imaging, require speed and gradient accuracy while putting high demands on the MR gradient system that may cause gradient distortion. Additionally, high field MR scans are prone to inhomogeneities that disturb the gradient system. Regardless of the source, gradient characterization provides a simple tool for distortion correction. An improved method, named the self-encoded slice selection algorithm, of characterizing the gradient system of the magnetic resonance system is proposed. It improves and combines the self-encode method and the direct slice selection method. The new approach is simple and fast, and allows for the measurement of waveform gradients that reach the system's limits. The technique is used to model the gradient system as a linear time-invariant transfer function through frequency-domain analysis and time-domain analysis. A transfer function model of the gradient system on the 3T Siemens Tim Trio scanner is presented here along with the characterization and analysis of common waveform gradients. Possible distortion correction approaches are also suggested.","abstract_has_math":false,"creators":["Cheng, Joseph Yitan"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.","school":null,"contributors":[],"advisors":["Elfar Adalsteinsson."],"committee_chairs":[],"committee_members":[],"year":2007,"date_issued":"2007","date_published":"2007","updated_at":"2026-07-22T22:22:13Z","subjects":["Electrical Engineering and Computer Science."],"languages":["eng"],"rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"rights_urls":["http://dspace.mit.edu/handle/1721.1/7582"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/1721.1/41257","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Elfar Adalsteinsson."]},{"key":"dc:contributor.department","label":"Department","values":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."]},{"key":"dc:contributor.other","label":"Dc Contributor Other","values":["Massachusetts Institute of Technology. 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They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://dspace.mit.edu/handle/1721.1/7582"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/1721.1/41257"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thesis (M. 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The technique is used to model the gradient system as a linear time-invariant transfer function through frequency-domain analysis and time-domain analysis. A transfer function model of the gradient system on the 3T Siemens Tim Trio scanner is presented here along with the characterization and analysis of common waveform gradients. Possible distortion correction approaches are also suggested."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["M.Eng."]},{"key":"dc:title","label":"Title","values":["Gradient characterization in magnetic resonance imaging"]}]}],"canonical_facts":{"dc:contributor.advisor":["Elfar Adalsteinsson."],"dc:contributor.department":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:contributor.other":["Massachusetts Institute of Technology. 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It improves and combines the self-encode method and the direct slice selection method. The new approach is simple and fast, and allows for the measurement of waveform gradients that reach the system's limits. The technique is used to model the gradient system as a linear time-invariant transfer function through frequency-domain analysis and time-domain analysis. A transfer function model of the gradient system on the 3T Siemens Tim Trio scanner is presented here along with the characterization and analysis of common waveform gradients. Possible distortion correction approaches are also suggested."],"dc:description.degree":["M.Eng."],"dc:identifier.uri":["http://hdl.handle.net/1721.1/41257"],"dc:language.iso":["eng"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. 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