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Massachusetts Institute of Technology

Design, fabrication, and characterization of germanium MOSFETs with high-k gate dielectric stacks based on the nitride interfacial layers

Abstract

dc:description.abstract

To improve source injection velocity, and consequently MOSFET performance, high mobility semiconductors are being explored as possible replacements for silicon. Germanium offers enhanced electron mobility and superior hole mobility at high inversion charge density; however, the formation of a high quality germanium-dielectric interface remains a serious challenge. High-k dielectrics deposited directly on germanium exhibit poor physical and electrical properties so an interfacial layer is required. Proposed interlayers include GeON, Si, and metal nitrides such as AIN and Hf3N4. This work focuses on the fabrication and characterization of germanium MOSFETs with GeON, Hf3N4, and AIN interlayers. WN/A1203/AIN gate stacks deposited by atomic layer deposition (ALD) were investigated in detail. The impact of AIN interlayer thickness and post-metal anneal conditions on the electrical properties of WN/A1203/AIN/Ge capacitors was determined. Optimal capacitance-voltage characteristics were achieved for an AIN thickness of 2.5 nm and 450-500 °C post-metal annealing. Ge n- and p-MOSFETs were fabricated with GeON, AIN, and Hf3N4 interlayers. The hole mobility of these devices generally matched or exceeded silicon universal hole mobility; however, Ge n-FETs showed poor electron mobility (50-100 cm2/Vs). Many theories have been proposed to explain the low carrier mobility of Ge n-FETs. These theories were investigated and it was found that an asymmetric distribution of interface states in the bandgap is the primary cause of low electron mobility for germanium-A1N interfaces. The interface state density near the conduction band edge approaches 6x1013 cm-2 eVl, approximately 5x higher than near the valence band edge.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2007

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Ritenour, Andrew P. (Andrew Paul), 1974-
Advisor dc:contributor.advisor
  • Dimitri A. Antoniadis.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/40545

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Ritenour, Andrew P. (Andrew Paul), 1974-. Design, fabrication, and characterization of germanium MOSFETs with high-k gate dielectric stacks based on the nitride interfacial layers. Massachusetts Institute of Technology, 2007. http://hdl.handle.net/1721.1/40545