Acquisition and modeling of material appearance

In computer graphics, the realistic rendering of synthetic scenes requires a precise description of surface geometry, lighting, and material appearance. While 3D geometry scanning and modeling have advanced significantly in recent years, measurement and modeling of accurate material appearance have remained critical challenges. Analytical models are the main tools to describe material appearance in most current applications. They provide compact and smooth approximations to real materials but lack the expressiveness to represent complex materials. Data-driven approaches based on exhaustive measurements are fully general but the measurement process is difficult and the storage requirement is very high. In this thesis, we propose the use of hybrid representations that are more compact and easier to acquire than exhaustive measurement, while preserving much generality of a data-driven approach. To represent complex bidirectional reflectance distribution functions (BRDFs), we present a new method to estimate a general microfacet distribution from measured data. We show that this representation is able to reproduce complex materials that are impossible to model with purely analytical models.

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2006

Author dc:creator

• Ngan, Wai Kit Addy, 1979-

Advisor dc:contributor.advisor

• Frédo Durand.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/38307
• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Identifier URI

http://dspace.mit.edu/handle/1721.1/38307

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/38307