Late standardization and technological catch-up

In this study, we examine the process of "late standardization," in which latecomers engage in standards activities in order to move towards and beyond the technological frontier. Based on case studies of latecomers in the semiconductor and mobile telecommunication industries in South Korea and Thailand, we analyze the strategic, organizational, and institutional aspects of the late-standardization process. We hypothesize that latecomer firms and states must engage in standards activities to progress beyond catch-up, because standards are a prerequisite to technological development. Standards are strategic leverages that allow latecomers to link with and learn from technology leaders. Specifically, latecomer firms have to engage internally in quality standardization to take advantage of latecomer advantages. Quality standards help improve production capability, while enhancing credibility and reputation. Without quality control, latecomers cannot become part of global value chains and have difficulty in acquiring advanced technologies from forerunners. As latecomers become fast followers, they have to participate in external standardization. The goal is to acquire knowledge about emerging technologies and standards.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Urban Studies and Planning.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2006

Author dc:creator

• Ratanawaraha, Apiwat, 1972-

Advisor dc:contributor.advisor

• Alice H. Amsden.

• Urban Studies and Planning.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/37674
• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Identifier URI

http://dspace.mit.edu/handle/1721.1/37674

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/37674