Imaging of absolute electrical properties using electroquasistatic and magnetoquasistatic sensor arrays

This research focuses on the enhancement of electroquasistatic and magnetoquasistatic nondestructive evaluation techniques. The terminals of the sensors involved are connected to conductors which are traditionally located on a single plane and have a spatially-periodic structure. The sensor operates as a two-port device with one conductor used to excite the sensor and a second conductor used to sense the response to test materials. Existing measurement capabilities are extended: 1. Multiple sensing elements are incorporated into electroquasistatic and magneto-quasistatic sensors such that the response can be accurately modeled. Single sensing element sensors which remain stationary on a test material's surface cannot provide information about variations in material properties along the surface. Scanning of a single element sensor requires many passes in order to provide high resolution property mapping of the surface. By introducing an array of sensing elements it is possible to provide stationary resolution and increase the rate at which a test material's surface can be mapped. Multiple sensing elements can also provide the ability to independently measure material properties that may otherwise be inseparable.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2006

Author dc:creator

• Schlicker, Darrell Eugene

Advisor dc:contributor.advisor

• Markus Zahn.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/37197

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/37197