A framework for non-intrusive load monitoring and diagnostics

The widespread use of electrical and electromechanical systems places increasing demands on monitoring and diagnostic techniques. The non-intrusive load monitor (NILM) provides a low-cost, low-maintenance way to perform this monitoring and diagnostics from a centralized location. This work critically evaluates the current state of the NILM hardware and software in order to develop new techniques and a new hardware and software framework in which to better apply the NILM to real-world systems. New diagnostic indicators are developed on the USCGC SENECA using an improved hardware and software platform. A database-driven framework with the flexibility to create and implement these and future diagnostic indicators is presented.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2006

Author dc:creator

• Paris, James, Ph. D. Massachusetts Institute of Technology

Advisor dc:contributor.advisor

• Steven B. Leeb and Robert W. Cox.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/37081

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/37081