{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/36776"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/36776","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"MIT integrated microelectronics device experimentation and simulation iLab","abstract":"We developed the MIT Integrated Microelectronics Device Experimentation and Simulation iLab, a new online laboratory that combines and significantly upgrades the capabilities of two existing online microelectronics labs: WebLab, a device characterization lab, and WebLabSim, a device simulation lab. The new integrated tool allows users to simultaneously run experiments on actual devices and simulations on the virtual ones, as well as to compare the results of the two. In order to achieve this, we considerably extended the capabilities of the original clients. We added the ability to graph the results of multiple experiments and simulations simultaneously, on top of each other, which allows for much easier comparison. We also added the ability to load, view and graph the results of experiments and simulations that were ran at any point in the past, even when the corresponding lab configurations are no longer available. Our hope is that this new integrated iLab will enrich microelectronics teaching and learning by allowing students to compare real life device behavior with theoretical expectations.","abstract_html":"We developed the MIT Integrated Microelectronics Device Experimentation and Simulation iLab, a new online laboratory that combines and significantly upgrades the capabilities of two existing online microelectronics labs: WebLab, a device characterization lab, and WebLabSim, a device simulation lab. The new integrated tool allows users to simultaneously run experiments on actual devices and simulations on the virtual ones, as well as to compare the results of the two. In order to achieve this, we considerably extended the capabilities of the original clients. We added the ability to graph the results of multiple experiments and simulations simultaneously, on top of each other, which allows for much easier comparison. We also added the ability to load, view and graph the results of experiments and simulations that were ran at any point in the past, even when the corresponding lab configurations are no longer available. Our hope is that this new integrated iLab will enrich microelectronics teaching and learning by allowing students to compare real life device behavior with theoretical expectations.","abstract_has_math":false,"creators":["Cukalovic, Boris"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.","school":null,"contributors":[],"advisors":["Jesús A. del Alamo."],"committee_chairs":[],"committee_members":[],"year":2006,"date_issued":"2006","date_published":"2006","updated_at":"2026-07-22T22:21:27Z","subjects":["Electrical Engineering and Computer Science."],"languages":["eng"],"rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"rights_urls":["http://dspace.mit.edu/handle/1721.1/7582"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/1721.1/36776","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Jesús A. del Alamo."]},{"key":"dc:contributor.department","label":"Department","values":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."]},{"key":"dc:contributor.other","label":"Dc Contributor Other","values":["Massachusetts Institute of Technology. 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They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://dspace.mit.edu/handle/1721.1/7582"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/1721.1/36776"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2006.","Includes bibliographical references (p. 57-58)."]},{"key":"dc:description.abstract","label":"Abstract","values":["We developed the MIT Integrated Microelectronics Device Experimentation and Simulation iLab, a new online laboratory that combines and significantly upgrades the capabilities of two existing online microelectronics labs: WebLab, a device characterization lab, and WebLabSim, a device simulation lab. The new integrated tool allows users to simultaneously run experiments on actual devices and simulations on the virtual ones, as well as to compare the results of the two. In order to achieve this, we considerably extended the capabilities of the original clients. We added the ability to graph the results of multiple experiments and simulations simultaneously, on top of each other, which allows for much easier comparison. We also added the ability to load, view and graph the results of experiments and simulations that were ran at any point in the past, even when the corresponding lab configurations are no longer available. Our hope is that this new integrated iLab will enrich microelectronics teaching and learning by allowing students to compare real life device behavior with theoretical expectations."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["M.Eng."]},{"key":"dc:title","label":"Title","values":["MIT integrated microelectronics device experimentation and simulation iLab"]}]}],"canonical_facts":{"dc:contributor.advisor":["Jesús A. del Alamo."],"dc:contributor.department":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:contributor.other":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:creator":["Cukalovic, Boris"],"dc:date.accessioned":["2007-03-12T17:52:42Z"],"dc:date.available":["2007-03-12T17:52:42Z"],"dc:date.issued":["2006"],"dc:description":["Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2006.","Includes bibliographical references (p. 57-58)."],"dc:description.abstract":["We developed the MIT Integrated Microelectronics Device Experimentation and Simulation iLab, a new online laboratory that combines and significantly upgrades the capabilities of two existing online microelectronics labs: WebLab, a device characterization lab, and WebLabSim, a device simulation lab. The new integrated tool allows users to simultaneously run experiments on actual devices and simulations on the virtual ones, as well as to compare the results of the two. In order to achieve this, we considerably extended the capabilities of the original clients. We added the ability to graph the results of multiple experiments and simulations simultaneously, on top of each other, which allows for much easier comparison. We also added the ability to load, view and graph the results of experiments and simulations that were ran at any point in the past, even when the corresponding lab configurations are no longer available. Our hope is that this new integrated iLab will enrich microelectronics teaching and learning by allowing students to compare real life device behavior with theoretical expectations."],"dc:description.degree":["M.Eng."],"dc:identifier.uri":["http://hdl.handle.net/1721.1/36776"],"dc:language.iso":["eng"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"dc:rights.uri":["http://dspace.mit.edu/handle/1721.1/7582"],"dc:subject":["Electrical Engineering and Computer Science."],"dc:title":["MIT integrated microelectronics device experimentation and simulation iLab"],"dc:type":["Thesis"]},"updated_at":"2026-07-22T22:21:27Z"}