Simulating scanning tunneling microscope measurements

One of the largest problems in scanning tunneling microscopy design is noise control. It is the burden of the designer to determine if money should be used to build a floating room for vibration isolation or for top-of-the-line preamplifiers that can be placed at low temperatures. This thesis presents a simulation of the STM measurement chain, from tunneling tip to computer control. The goal is to see how noise at different stages of the measurement chain affect the output of spectroscopy (density of states) measurements. Specifically, we look at how spectroscopy measurements depend on the temperature of the sample, the density of states in the sample and tip, the shakiness of the tip, the noise present in the current preamplifier, and several other settings. Chapter 1 describes STM spectroscopy measurement, Chapter 2 explains how it is simulated, and Chapter 3 finally looks at the results of various simulations.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Physics.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2006

Author dc:creator

• Venkatachalam, Vivek

Advisor dc:contributor.advisor

• Eric W. Hudson.

• Physics.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/36116

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/36116