Massachusetts Institute of Technology
Thin optic surface analysis for high resolution X-ray telescopes
Abstract
dc:description.abstractThe art of glass developed throughout the years has covered artifacts ranging from crude ornaments to high precision optics used in flat panel displays, hard disk drives, and x-ray telescopes. Methods for manufacturing glass sheets and further sheet shaping processes are covered. Future generation, high resolution x-ray telescopes require thin optics with large surface area to thickness ratio and a surface flatness of -500 nm. A novel method utilizing porous ceramics, which provide a thin layer of air for sheet glass to rest on during the shaping process, is investigated. The shaping process involves slumping glass on a uniform layer of air at elevated temperatures, where the viscosity of glass is low enough for it to sag under its own weight and replicate the surface it rests on. Flow in porous, rectangular air bearings is covered with both flat and grooved surfaces. The pressure distribution in the air gap between the ceramic and the glass sheet determines the surface quality of glass during slumping. The mechanical integrity of porous ceramics at elevated temperatures is investigated to predict the effect of the decrease in ceramic stiffness on the final shape of the optic.
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Dept. of Mechanical Engineering.
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 2004
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Akilian, Mireille
- Advisor dc:contributor.advisor
-
- Mark L. Schattenburg and Samir Nayfeh.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/34556
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/34556