Measurement and device design of left-handed metamaterials

The properties of a variety of left-handed metamaterial (LHM) structures are analyzed and measured to verify consistent behavior between theory an measurements. The structures are simulated using a commercial software program and a retrieval algorithm is used to determine the effective constitutive parameters. The constitutive parameters are used to predict the behavior of the metamaterial under various configurations. Measurements are conducted to verify the presence of a negative index of refraction. Transmission through an LHM slab from several incidences is shown to be consistent with theory. A four-port device utilizing the dispersive nature of an LHM prism is designed and measured. The measurements show that the refraction angle of an incident signal is frequency dependent. Two ports are constructed to receive the positively refracted and negatively refracted power. In the frequency band where the incident signal cannot propagate in the LHM prism, the power is reflected from the interface towards a third measurement port. The three ports are shown to achieve unique mutually exclusive bandwidths. A general study is conducted on the design of such a device. Finally, the use of a left-handed metamaterial as a substrate for a microstrip line is investigated.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2005

Author dc:creator

• Thomas Zachary M. (Zachary Michael)

Advisor dc:contributor.advisor

• Jin Au Kong and Tomasz M. Grzegorczyk.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/34122

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/34122