Full-wave algorithms for model order reduction and electromagnet analysis of impedance and scattering

As technology advances and sophisticated electronic systems achieve ubiquity, the demand for thorough, efficient Electromagnetic (EM) analysis continues to rise. The prohibitive costs of constructing and maintaining measurement facilities and designing and buildin-l system prototypes has fueled even greater demand for Computational Electromagnetics (CEM). Today's CEM solvers can generate models that accurately characterize the EM behavior of an arbitrary structure presented for analysis. Two important applications for CEM are Scattering analysis of targets excited by EM waves and impedance modelling for the interconnect between the electronic components in Systems on Package (SoP) and Systems on Board (SoB). Often, the goal of analysis is to characterize behavior relative to parameters of interest. and EMI solvers can generate paralneter-depenldent models of the system. The complexity of structures has increased so much that solving the solver-generated models at numerous desired parameter-points is a daunting computational task. For example, using these models in a simulator would be infeasible.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2005

Author dc:creator

• Klemas, Thomas J. (Thomas Jonas)

Advisor dc:contributor.advisor

• Jacob K. White.

• Electrical Engineering and Computer Science.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/33922

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/33922