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Massachusetts Institute of Technology

Eclat : automatic generation and classification of test inputs

Abstract

dc:description.abstract

This thesis describes a technique that selects, from a large set of test inputs, a small subset likely to reveal faults in the software under test. The technique takes a program or software component, plus a set of correct executions-say, from observations of the software running properly, or from an existing test suite that a user wishes to enhance. The technique first infers an operational model of the software's operation. Then, inputs whose operational pattern of execution differs from the model in specific ways are suggestive of faults. These inputs are further reduced by selecting only one input per operational pattern. The result is a small portion of the original inputs, deemed by the technique as most likely to reveal faults. Thus, the technique can also be seen as an error-detection technique. The thesis describes two additional techniques that complement test input selection. One is a technique for automatically producing an oracle (a set of assertions) for a test input from the operational model, thus transforming the test input into a test case. The other is a classification-guided test input generation technique that also makes use of operational models and patterns. When generating inputs, it filters out code sequences that are unlikely to contribute to legal inputs, improving the efficiency of its search for fault-revealing inputs.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2005

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Pacheco, Carlos, S.M. Massachusetts Institute of Technology
Advisor dc:contributor.advisor
  • Michael D. Ernst.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/33855
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/33855

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Pacheco, Carlos, S.M. Massachusetts Institute of Technology. Eclat : automatic generation and classification of test inputs. Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/33855