Massachusetts Institute of Technology
Electrochemical kinetics of thin film vanadium pentoxide cathodes for lithium batteries
Abstract
dc:description.abstractElectrochemical experiments were performed to investigate the processing-property-performance relations of thin film vanadium pentoxide cathodes used in lithium batteries. Variations in microstructures were achieved via sputtering and anneal treatments, resulting in films with different morphologies, grain size distributions, and orientations. Key findings included (1) grain size distributions largely did not affect the current rate performance of the cathodes. Rather, the film orientation and the ability to undergo rapid phase transformation were more vital to improving performance; (2) interfacial resistance and ohmic polarization were also dominant at the high current rates used (> 600 [mu]A/cm²) in addition to solid diffusion; and (3) optimization of thin film batteries requires that film thickness be < 500 nm to avoid diminishing returns in power and energy densities. Kinetic parameters including the transfer coefficient ([alpha] = 0.90± 0.05) and standard rate constant (k⁰ [approx.] 2 x 10⁻⁶ cm/s) for vanadium pentoxide films were quantified using slow scan DC cyclic voltammetry and AC cyclic voltammetry. The reaction rate was found to be potentially limiting at moderate to high current rates (> 200 [mu]A/cm²).
Degree
thesis:*- Department dc:contributor.department
- Massachusetts Institute of Technology. Dept. of Materials Science and Engineering.
- Grantor dc:publisher
- Massachusetts Institute of Technology
- Year dc:date.issued
- 2005
Author and committee
dc:creator, dc:contributor.*- Author dc:creator
-
- Mui, Simon C., 1976-
- Advisor dc:contributor.advisor
-
- Donald R. Sadoway.
Subjects
dc:subject × 1Rights
dc:rights- Statement dc:rights
-
- M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
- Licence dc:rights.uri
- Language dc:language.iso
- eng
Identifiers
dc:identifier.*- Handle dc:identifier.uri
- http://hdl.handle.net/1721.1/33607
- OAI identifier oai:identifier
- oai:dspace.mit.edu:1721.1/33607