The effect of probe tilt angle on the quality of scanning tunneling microscope measurements

The effect of probe tilt angle on the quality of Scanning Tunneling Microscopy (STM) measurements was explored. A small but consistent improvement in slope accuracy was documented lending some support to the effort to develop a new, five-axis STM capable of tilting in a controlled manner while scanning. The objective of such a machine would be to allow its probe to trace the sample's contour with greater accuracy than the currently available three-axis STM can. It is postulated that an STM with a probe that can change its roll and pitch in addition to its position along the traditional x, y, and z axes would be capable of reducing imaging errors produced as a result of geometric constraints, lateral electron discharge effects, and the tendency for the tip to bend during scanning due to electrostatic surface forces. In order to quantify the effects of incorporating probe tilt into the scanning process, a traditional, three-axis STM was manipulated in a way that allowed a standard sample grid to be imaged using a probe that was placed at seven different angles of tilt ranging from -13 to +13 degrees. Twenty-five different cavities in a standard STM scanning sample were scanned at these seven angles to determine notable trends and effects in the images produced.

Department dc:contributor.department

Massachusetts Institute of Technology. Dept. of Mechanical Engineering.

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2005

Author dc:creator

• Hopkins, Jonathan B. (Jonathan Brigham)

Advisor dc:contributor.advisor

• Martin L. Culpepper.

• Mechanical Engineering.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/32888

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/32888