A new model for electric force microscopy and its application for electrostatically generated phase difference in tapping mode AFM

The harmonic force balance method was used to model and simulate electric force microscopy (EFM) and electrostatically generated phase difference in tapping mode AFM (EPTA) measurements. Simulations show that the harmonic force balance approach matches and explains EFM and EPTA experimental results well. Simulations also show that the model depended on both geometric and materials parameters. The harmonic force balance model was subsequently used to directly simulate a previously performed EPTA experiment. Data obtained from the model showed a remarkable similarity to the experimentally obtained data, thus validating the use of the harmonic force balance model to simulate EPTA data.

Department dc:contributor.department

Massachusetts Institute of Technology. Department of Materials Science and Engineering

Grantor dc:publisher

Massachusetts Institute of Technology

Year dc:date.issued

2005

Author dc:creator

• Stone, Peter (Peter Robert)

Advisor dc:contributor.advisor

• Francisco Stellacci.

• Materials Science and Engineering.

Statement dc:rights

• M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.

Licence dc:rights.uri

• http://dspace.mit.edu/handle/1721.1/7582

Language dc:language.iso

eng

Handle dc:identifier.uri

http://hdl.handle.net/1721.1/32855

OAI identifier oai:identifier

oai:dspace.mit.edu:1721.1/32855