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Massachusetts Institute of Technology

Surface forces during electrophoretic assembly of micron scale silica particles

Abstract

dc:description.abstract

A system of platinum microelectrodes was fabricated on a sapphire substrate by lithographic patterning and used to manipulate 1.58 [mu]m silica particles in-plane. A digital video system was used to image the motion of particles far from the electrodes and their deposition onto the working electrode during application of a DC potential. The role of electrode reversibility was investigated and the performance of the as-deposited electrodes was improved by electrolytic plating of platinum. Particles were also seen to adhere to the substrate before reaching the electrode. Force distance curves were recorded using a colloid probe atomic force microscopy technique to directly measure the interaction of the silica particles with the sapphire substrate. This data validated the observed adhesion at the electrode and provided further support for the temporal and spatial reduction in pH. The role of Faradaic processes and the diffusion of potential determining ions in electrophoretic deposition was also considered. The zeta potential of planar sapphire substrates for three different crystallographic orientations was measured by a streaming potential technique in the presence of KCl and (CH3)4NCl electrolytes. The streaming potential was measured for large single crystalline C-plane (0001), A-plane (1120), and R-plane (1102) wafers over a full pH range at three or more ionic strengths ranging from 1 to 100 mM. The results reveal a shift in the iso-electric point (i.e.p.) of the three samples by as much as two pH units, with the R-plane surface exhibiting the most acidic behavior and the C-plane samples having the highest i.e.p.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Materials Science and Engineering.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2004

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Kershner, Ryan J. (Ryan Joseph), 1976-
Advisor dc:contributor.advisor
  • Michael J. Cima.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/30122
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/30122

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Kershner, Ryan J. (Ryan Joseph), 1976-. Surface forces during electrophoretic assembly of micron scale silica particles. Massachusetts Institute of Technology, 2004. http://hdl.handle.net/1721.1/30122