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Massachusetts Institute of Technology

Scanning standing-wave illumination microscopy : a path to nanometer resolution in X-ray microscopy

Abstract

dc:description.abstract

X-ray microscopy can potentially combine the advantages of light microscopy with resolution approaching that of electron microscopy. In theory, x-ray microscopes can image unsectioned hydrated cells with nanometer resolution. In practice, however, the resolution of x-ray microscopes is limited to approximately 20 nm due to difficulties in the construction of high numerical-aperture (NA) x-ray focusing optics. This thesis represents a step on a new path to nanometer resolution in x-ray microscopy by proposing and demonstrating scanning standing-wave illumination (SWI) microscopy. In scanning SWI microscopy, lensless focusing is achieved with the interference of large numbers of phase-aligned planar wavefronts. Resolution is determined primarily by the NA synthesized by the planar wavefronts, circumventing the need for high-NA optical components. Both theoretical and experimental work conducted at visible wavelengths is presented. An electromagnetic theory of image formation in scanning SWI fluorescence microscopy is developed. The point spread function is remarkably well-suited to Fourier analysis and can be analyzed using graphical techniques. Phase alignment is accomplished by maximizing the intensity of light scattered or fluoresced by a point-like particle using an iterative algorithm that is guaranteed to converge monotonically. A prototype scanning SWI microscope with 15 phase-modulated linearly-polarized laser beams arranged in a 0.95-NA radially-polarized circular cone and a 0.25-NA objective lens is presented. Sub-wavelength resolution according to both classical resolution criteria (i.e., measurement of the point-spread function) and modern resolution criteria (i.e., investigation of limits imposed by noise in computationally restored images) is demonstrated.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2005

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Hong, Stanley Seokjong, 1977-
Advisor dc:contributor.advisor
  • Dennis M. Freeman.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
en_US

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/27868
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/27868

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Hong, Stanley Seokjong, 1977-. Scanning standing-wave illumination microscopy : a path to nanometer resolution in X-ray microscopy. Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/27868