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Massachusetts Institute of Technology

Strain-engineered CMOS-compatible Ge photodetectors

Abstract

dc:description.abstract

The development of CMOS-compatible photodetectors capable of operating throughout the entire telecommunications wavelength spectrum will aid in the integration of photodetectors with Si microelectronics, thus offering a low cost platform for high performance photoreceivers. This thesis demonstrates the first CMOS process compatible high-responsivity Ge p-i-n diodes for 1.55 [mu]m wavelengths. The thermal expansion mismatch between Ge epilayers and Si substrates was used to engineer tensile strain upon cooling from the growth temperature. This 0.2% tensile strain results in a lowering of the direct transition energy in Ge by 30 meV and extends the responsivity curve to near 1.6[mu]m. Design rules are given for high speed and high responsivity, and the advantages of waveguide integration for simultaneous achievement of high speed and high responsivity are illustrated. It is shown that waveguide integration has advantages to vertical illumination when optical saturation is considered. Optical saturation will become important as photodetector sizes shrink to the order of a few tens of microns in diameter. High Ge content SiGe could have applications for a SiGe electro-optic modulator utilizing the Franz-Keldysh effect. High Ge content SiGe films have been grown on Si substrates. The Franz-Keldysh effect has been observed in our pure Ge films as an increase in responsivity with increasing reverse bias for wavelengths longer than the bandgap energy. .

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Materials Science and Engineering.
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
2004

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Cannon, Douglas Dale, 1974-
Advisor dc:contributor.advisor
  • Lionel C. Kimerling.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/17676
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/17676

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
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citation

Cannon, Douglas Dale, 1974-. Strain-engineered CMOS-compatible Ge photodetectors. Massachusetts Institute of Technology, 2004. http://hdl.handle.net/1721.1/17676