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Massachusetts Institute of Technology

Electrostatic deflection of free-standing tungsten microbridges as a novel means for characterization of thin film mechanical properties

Abstract

dc:description

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994.

Degree

thesis:*
Department dc:contributor.department
Massachusetts Institute of Technology. Dept. of Materials Science and Engineering
Grantor dc:publisher
Massachusetts Institute of Technology
Year dc:date.issued
1994

Author and committee

dc:creator, dc:contributor.*
Author dc:creator
  • Huguenin, S. Carolene
Advisor dc:contributor.advisor
  • C.V. Thompson, II.

Subjects

dc:subject × 1

Rights

dc:rights
Statement dc:rights
  • M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Language dc:language.iso
eng

Identifiers

dc:identifier.*
Handle dc:identifier.uri
http://hdl.handle.net/1721.1/17389
OAI identifier oai:identifier
oai:dspace.mit.edu:1721.1/17389

Chain of custody

source
Harvested from
MIT
Base URL
dspace.mit.edu/oai/request
Last updated
2026-07-22
Source record
OAI-PMH GetRecord
citation

Huguenin, S. Carolene. Electrostatic deflection of free-standing tungsten microbridges as a novel means for characterization of thin film mechanical properties. Massachusetts Institute of Technology, 1994. http://hdl.handle.net/1721.1/17389