{"id":{"repo_id":"mit","oai_identifier":"oai:dspace.mit.edu:1721.1/16943"},"canonical_url":"https://search.dev.ndltd.org/etd/mit/oai:dspace.mit.edu:1721.1/16943","repository":{"repo_id":"mit","name":"MIT","base_url":"https://dspace.mit.edu/oai/request"},"display":{"title":"High-reliability architectures for networks under stress","abstract":"In this thesis, we develop a methodology for architecting high-reliability communication networks. Previous results in the network reliability field are mostly theoretical in nature with little immediate applicability to the design of real networks. We bring together these contributions and develop new results and insights which are of value in designing networks that meet prescribed levels of reliability. Furthermore, most existing results assume that component failures are statistically independent in nature. We take initial steps in developing a methodology for the design of networks with statistically dependent link failures. We also study the architectures of networks under extreme stress.","abstract_html":"In this thesis, we develop a methodology for architecting high-reliability communication networks. Previous results in the network reliability field are mostly theoretical in nature with little immediate applicability to the design of real networks. We bring together these contributions and develop new results and insights which are of value in designing networks that meet prescribed levels of reliability. Furthermore, most existing results assume that component failures are statistically independent in nature. We take initial steps in developing a methodology for the design of networks with statistically dependent link failures. We also study the architectures of networks under extreme stress.","abstract_has_math":false,"creators":["Weichenberg, Guy E. (Guy Elli), 1978-"],"institution":"Massachusetts Institute of Technology","degree_name":null,"degree_level":null,"degree_discipline":null,"degree_department":"Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.","school":null,"contributors":[],"advisors":["Vincent W.S. Chan and Muriel Médard."],"committee_chairs":[],"committee_members":[],"year":2003,"date_issued":"2003","date_published":"2003","updated_at":"2026-07-22T22:21:24Z","subjects":["Electrical Engineering and Computer Science."],"languages":["eng"],"rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"rights_urls":["http://dspace.mit.edu/handle/1721.1/7582"],"identifier_entries":[]},"links":{"outbound_url":"http://hdl.handle.net/1721.1/16943","outbound_label":"Handle","outbound_source":"dc:identifier.uri"},"metadata_groups":[{"id":"people","label":"People","entries":[{"key":"dc:contributor.advisor","label":"Advisor","values":["Vincent W.S. Chan and Muriel Médard."]},{"key":"dc:contributor.department","label":"Department","values":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."]},{"key":"dc:contributor.other","label":"Dc Contributor Other","values":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."]},{"key":"dc:creator","label":"Author","values":["Weichenberg, Guy E. (Guy Elli), 1978-"]}]},{"id":"academic_context","label":"Academic Context","entries":[{"key":"dc:date.accessioned","label":"Dc Date Accessioned","values":["2005-05-19T15:22:41Z"]},{"key":"dc:date.available","label":"Dc Date Available","values":["2005-05-19T15:22:41Z"]},{"key":"dc:date.issued","label":"Date","values":["2003"]},{"key":"dc:publisher","label":"Institution","values":["Massachusetts Institute of Technology"]},{"key":"dc:type","label":"Dc Type","values":["Thesis"]}]},{"id":"subjects_keywords","label":"Subjects and Keywords","entries":[{"key":"dc:subject","label":"Dc Subject","values":["Electrical Engineering and Computer Science."]}]},{"id":"language_rights","label":"Language and Rights","entries":[{"key":"dc:language.iso","label":"Language (ISO)","values":["eng"]},{"key":"dc:rights","label":"Dc Rights","values":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."]},{"key":"dc:rights.uri","label":"Rights URI","values":["http://dspace.mit.edu/handle/1721.1/7582"]}]},{"id":"identifiers","label":"Identifiers","entries":[{"key":"dc:identifier.uri","label":"Identifier URI","values":["http://hdl.handle.net/1721.1/16943"]}]},{"id":"additional","label":"Additional Metadata","entries":[{"key":"dc:description","label":"Description","values":["Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.","Includes bibliographical references (p. 157-165).","This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections."]},{"key":"dc:description.abstract","label":"Abstract","values":["In this thesis, we develop a methodology for architecting high-reliability communication networks. Previous results in the network reliability field are mostly theoretical in nature with little immediate applicability to the design of real networks. We bring together these contributions and develop new results and insights which are of value in designing networks that meet prescribed levels of reliability. Furthermore, most existing results assume that component failures are statistically independent in nature. We take initial steps in developing a methodology for the design of networks with statistically dependent link failures. We also study the architectures of networks under extreme stress."]},{"key":"dc:description.degree","label":"Dc Description Degree","values":["S.M."]},{"key":"dc:format.mimetype","label":"Dc Format Mimetype","values":["application/pdf"]},{"key":"dc:title","label":"Title","values":["High-reliability architectures for networks under stress"]}]}],"canonical_facts":{"dc:contributor.advisor":["Vincent W.S. Chan and Muriel Médard."],"dc:contributor.department":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:contributor.other":["Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science."],"dc:creator":["Weichenberg, Guy E. (Guy Elli), 1978-"],"dc:date.accessioned":["2005-05-19T15:22:41Z"],"dc:date.available":["2005-05-19T15:22:41Z"],"dc:date.issued":["2003"],"dc:description":["Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003.","Includes bibliographical references (p. 157-165).","This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections."],"dc:description.abstract":["In this thesis, we develop a methodology for architecting high-reliability communication networks. Previous results in the network reliability field are mostly theoretical in nature with little immediate applicability to the design of real networks. We bring together these contributions and develop new results and insights which are of value in designing networks that meet prescribed levels of reliability. Furthermore, most existing results assume that component failures are statistically independent in nature. We take initial steps in developing a methodology for the design of networks with statistically dependent link failures. We also study the architectures of networks under extreme stress."],"dc:description.degree":["S.M."],"dc:format.mimetype":["application/pdf"],"dc:identifier.uri":["http://hdl.handle.net/1721.1/16943"],"dc:language.iso":["eng"],"dc:publisher":["Massachusetts Institute of Technology"],"dc:rights":["M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission."],"dc:rights.uri":["http://dspace.mit.edu/handle/1721.1/7582"],"dc:subject":["Electrical Engineering and Computer Science."],"dc:title":["High-reliability architectures for networks under stress"],"dc:type":["Thesis"]},"updated_at":"2026-07-22T22:21:24Z"}